Optics and photonics. Measurement method of semiconductor lasers for sensing1 Scope This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications. This document is applicable to all kinds of semiconductor lasers, such as edge emitting type and vertical cavity surface emitting type lasers, bulk type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing

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