Integrated circuits. Measurement of electromagnetic emissions - Measurement of radiated emissions. Surface scan method1 Scope This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. This test procedure is applicable to measurements on an IC mounted on any circuit board that is accessible to the

telephone equipment

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test modules

This document defines the principles

or as can be reasonably expected

ISO/IEC 29101 describes a high-level architecture framework and associated controls for the safeguarding of privacy in information and communication technology (ICT) systems that store and process personally identifiable information (PII)

— system architectural design

PD CEN/TR 16469 also guides on references gauges

Method C — Crumple/flex method

as well as the environmental conditions

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